Read Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Fred Stevie Online

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This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained It also will serve as a reference for those who need to provide SIMS data The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique....

Title : Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
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ISBN : 1606505882
Format Type : Paperback
Language : English
Publisher : Momentum Press September 15, 2015
Number of Pages : 290 pages
File Size : 866 KB
Status : Available For Download
Last checked : 21 Minutes ago!

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization Reviews

  • ScottieW
    2019-03-26 21:48

    Great introduction to SIMS. Hard to beat this quality for the price of the book. I highly recommend, especially if new to the technique.